6½-digit Supply Measure Unit All-in-One Machine ANSMU200-3(F)

The ANSMU200-3(F) is a high-precision, high-resolution, and multifunctional supply measure unit (SMU). It adopts a combined technology of a low-noise power supply and high-precision measurement, supports four-quadrant operation, and features low noise, high precision, and fast response.

The voltage and current output and measurement ranges are wide, enabling output and measurement of up to ±210 V voltage and ±3.15 A current. Additionally, it includes resistance and power measurement functions, supporting both two-terminal and four-terminal measurement modes. It features multiple voltage and current ranges, with a maximum display digits of 6½-digit, and a minimum resolution down to 10nV/10fA. It is equipped with functions such as sweeping, scripting, and support for flowchart editing, and provides a rich set of communication interfaces.

The ANSMU200-3(F) Supply Measure Unit All-in-one Machine plays a crucial role in fields such as semiconductors, materials science, and optoelectronic devices.

• Four-quadrant full-scale operation.

• Wide source and measurement range: Voltage ±210V, Current ±3.15A.

• Low-noise linear power supply technology with output noise < 3mVrms.

• Voltage, current, resistance, and power measurements can be performed in both CV and CC modes.

• Supports both front and rear panel output and measurement, and supports 2-wire and 4-wire measurement methods.

• A built-in high-precision integrating ADC for precision measurement, and a dual-channel high-speed digital ADC to meet high-speed sampling test requirements.

• 6½-digit measurement display with minimum voltage/current resolution down to 10nV/10fA.

• High measurement accuracy: Up to 0.002% at the optimum point.

• Voltage measurement input impedance > 10GΩ.

• 5-inch color touchscreen for easy operation and intuitive display.

• Data statistics interface with line chart and table views.

• Voltage limit, current limit, and overtemperature protection functions.

• Rich waveform editing functions supporting sweep, pulse, flowchart, and script modes.

• Multiple communication interfaces: serial port, LAN port, GPIB, and user-configurable digital I/O.

• Multi-unit synchronous testing via A-LINK with multiple supply-measure units.

• Support triaxial shielded cable connection for effective noise reduction and high-precision measurement.

• Testing of discrete devices and passive components, such as diodes, BJTs, FETs, resistors, etc.

• Testing of semiconductor structures such as wafers and thin films.

• Testing of new materials such as graphene and nanomaterials.

• Testing of optoelectronic devices such as LEDs, AMOLEDs, photovoltaics, and solar cells.

• Testing of electrochemical applications such as cyclic voltammetry, battery charge/discharge cycles, and electrodeposition.

• Material characterization including resistivity, Hall effect, and high-ohmic resistance testing.